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Dynamics of Null and Electrostatic Blind Spots for Quantitative PFM
Marti Checa, Holland Swicegood, Ruben Millan-Solsona +5
Piezoresponse force microscopy is a cornerstone technique for probing nanoscale electromechanical phenomena, yet quantitative and in some cases qualitative interpretation remains h…
AEcroscopyWave: Towards Self-Driving Characterization Platforms for Agentic AI
Yongtao Liu, Jawad Chowdhury, Ganesh Narasimha +8
The characterization of electronic materials has traditionally been stratified into two distinct regimens: industry-scale automated systems to inspect materials for defects and ens…
Auto-3DPFM: Automating Polarization-Vector Mapping at the Nanoscale
Ralph Bulanadi, Marti Checa, Michelle Wang +9
The functional properties of ferroelectric materials are strongly influenced by ferroelectric polarization orientation; as such, access to consistent and precise characterization o…
Human-AI collaborative autonomous synthesis with pulsed laser deposition for remote epitaxy
Asraful Haque, Daniel T. Yimam, Jawad Chowdhury +10
Autonomous laboratories typically rely on data-driven decision-making, occasionally with human-in-the-loop oversight to inject domain expertise. Fully leveraging AI agents, however…
Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy
Utkarsh Pratiush, Austin Houston, Kamyar Barakati +70
Microscopy is a primary source of information on materials structure and functionality at nanometer and atomic scales. The data generated is often well-structured, enriched with me…