2 papers
cond-mat.mtrl-sci2025
Performance and reliability potential of BiOSe/BiSeO transistors
Mohammad Rasool Davoudi, Mina Bahrami, Axel Verdianu +16
While 2D materials have enormous potential for future device technologies, many challenges must be overcome before they can be deployed at an industrial scale. One of these challen…
cond-mat.mes-hall2025
Device-scaling constraints imposed by the van der Waals gap formed in two-dimensional materials
Mahdi Pourfath, Tibor Grasser
Transistor miniaturization requires controlling gate leakage through ultrathin dielectrics and minimizing source/drain contact resistance. Although two-dimensional (2D) semiconduct…