3 papers
cs.IR2026
Topological Void Analysis A Mathematical Framework for Systematic Technical Innovation Discovery in Knowledge Spaces
Kris Pan
Identifying where to innovate in a dense technical domain - such as operating systems or hardware/software co-design - is fundamentally a search problem in a high-dimensional knowl…
cs.AI2026
RoPoLL: Robust Panel of LLM Judges
Anish Acharya, Kris W Pan, Brian Verkhovsky
The LLM Jury, a Panel of LLM Evaluators (PoLL) reporting consensus scores, has become a practical alternative to single-judge LLM evaluation, yet its statistical behavior remains p…
cs.CL2026
Pat-DEVAL: Chain-of-Legal-Thought Evaluation for Patent Description
Yongmin Yoo, Kris W Pan
Patent descriptions must deliver comprehensive technical disclosure while meeting strict legal standards such as enablement and written description requirements. Although large lan…