most citedDeep Learning-based Single-Shot Composite Fringe Projection Profilometry with Pixel-Wise Uncertainty Quantification

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cond-mat.mtrl-sci2011

Analysing surface structures on (Ga,Mn)As by Atomic Force Microscopy

S. Piano, A. W. Rushforth, K. W. Edmonds +3

Using atomic force microscopy, we have studied the surface structures of high quality molecular beam epitaxy grown (Ga,Mn)As compound. Several samples with different thickness and…