activity
20242026
collaborators

11 papers

eess.SP2026

Accuracy of Joint Time-Based and Carrier-Phase Positioning in 5G Networks under Correlated Measurement Errors

Nahidul Islam, Mohammad Razzaghpour, Marwan Hammouda +2

High-accuracy positioning is critical for emerging applications such as autonomous driving, industrial automation, augmented reality, and smart cities. 3GPP Release 18 introduced c…

eess.SP2026

Optimized Sampling of Angle-Resolved Scatterometry Data Using End-to-End Compressed Learning Model for Nanograss Deficiency Detection

Mehdi Abdollahpour, Carsten Bockelmann, Armin Dekorsy

Reliable inspection of nanosurfaces is essential to ensure the quality of nanostructure manufacturing. Angle-resolved scatterometry provides a non-invasive inspection method that c…

eess.SP2026

Semantic Communication for Cooperative Multi-Tasking over Rate-Limited Wireless Channels with Implicit Optimal Prior

Ahmad Halimi Razlighi, Carsten Bockelmann, Armin Dekorsy

In this work, we expand the cooperative multi-task semantic communication framework (CMT-SemCom) introduced in [1], which divides the semantic encoder on the transmitter side into…

eess.SP2025

Model-Free Robust Beamforming in Satellite Downlink using Reinforcement Learning

Alea Schröder, Steffen Gracla, Carsten Bockelmann +2

Satellite-based communications are expected to be a substantial future market in 6G networks. As satellite constellations grow denser and transmission resources remain limited, fre…

eess.SP2025

Semantic Communication for Task Execution and Data Reconstruction in Multi-View Scenarios

Maximilian H. V. Tillmann, Avinash Kankari, Carsten Bockelmann +1

Semantic communication has gained significant attention with the advances in machine learning. Most semantic communication works focus on either task execution or data reconstructi…

eess.SP2025

Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data

Mehdi Abdollahpour, Carsten Bockelmann, Tajim Md Hasibur Rahman +2

Nanoscale manufacturing requires high-precision surface inspection to guarantee the quality of the produced nanostructures. For production environments, angle-resolved scatterometr…