13 citations · 13 across the 5 of their papers we have counts for
3 papers · 1 filter
A Fourier-Based Global Denoising Model for Smart Artifacts Removing of Microscopy Images
Huanhuan Zhao, Connor Vernachio, Laxmi Bhurtel +9
Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and n…
Single-particle detection of a semiconductor-to-metal transition by scanning dielectric microscopy
Ruben Millan-Solsona, José A. Ruiz-Torres, Carlos Moya +5
Hybrid nanostructures that combine semiconducting and metallic components offer great potential for photothermal therapy, optoelectronics, and sensing, by integrating tunable optic…
A Bi-channel Aided Stitching of Atomic Force Microscopy Images
Huanhuan Zhao, Ruben Millan-Solsona, Marti Checa +4
Microscopy is an essential tool in scientific research, enabling the visualization of structures at micro- and nanoscale resolutions. However, the field of microscopy often encount…