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20232026
most citedAn open-source robust machine learning platform for real-time detection and classification of 2D material flakes

25 citations · 32 across the 7 of their papers we have counts for

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cs.LG2025★ 2 cited

Deep Learning to Automate Parameter Extraction and Model Fitting of Two-Dimensional Transistors

Robert K. A. Bennett, Jan-Lucas Uslu, Harmon F. Gault +8

We present a deep learning approach to extract physical parameters (e.g., mobility, Schottky contact barrier height, defect profiles) of two-dimensional (2D) transistors from elect…