Extreme-ultraviolet optical response of atomically-thin molybdenum disulfide

G. Fiorentini, N. Di Palo, G. Inzani +18

We report multi-angle reflectivity measurements in the extreme-ultraviolet (XUV) range for mono- and bilayer MoS${}_2$ on a Si${}_3$N${}_4$ substrate. Using a single-sheet 2D conductivit…