Euclid: Methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS

J. Le Graet, A. Secroun, M. Tourneur-Silvain +121

We introduce a fast method to measure the conversion gain in Complementary Metal-Oxide-Semiconductors (CMOS) Active Pixel Sensors (APS), which accounts for nonlinearity and interpi…