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cs.CE2026
From Sparse AFM Observations to Probabilistic Macroscale Mechanics: A Generative-Physics Framework for Plant Cell Walls
Samundra Karki, Angona Biswas, Nabila Masud +3
Nanoscale imaging of developing plant cell walls is expensive, and a limited number of atomic force microscopy (AFM) scans cannot capture the full structural variability of the wal…
cs.CV2026
Artifact Removal and Image Restoration in AFM:A Structured Mask-Guided Directional Inpainting Approach
Juntao Zhang, Angona Biswas, Jaydeep Rade +5
Atomic Force Microscopy (AFM) enables high-resolution surface imaging at the nanoscale, yet the output is often degraded by artifacts introduced by environmental noise, scanning im…