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physics.optics2026

UV-enhanced SEM: towards orientation and electron work function imaging

Maciej Kretkowski, Haoran Mu, Hsin-Hui Huang +6

Deep-UV ~ 250 nm (4.96 eV) tilted in-situ co-illumination of the sample under imaging by scanning electron microscope (SEM) is developed at a robust and practical instrument level.…

physics.optics2026

Nanoscale Surface Analysis of High Entropy Alloy

Hsin-Hui Huang, Meguya Ryu, Yoshiaki Nishijima +10

Nanoscale surface analysis of 1 micrometer thick high entropy alloys (HEAs) was carried out using nano-IR for hyperspectral imaging and single point spectroscopy in the 700-1700 1/…

physics.optics2026

Structure orientation determined in transmission and reflection: q-plate

Hsin-Hui Huang, Meguya Ryu, Shuji Kamegaki +9

Determination of orientation in the imaged sample/scene has a large application potential when the anisotropy of properties is analysed, usually, under a linearly polarised illumin…

physics.optics2026

Burst-mode fs-laser direct writing for full-thickness oxidation of Ta thin films

Lina Grineviciute, Hsin-Hui Huang, Haoran Mu +5

Direct fs-laser (1030~nm/200~fs) write of a throughout oxide TaO on a 200~nm Ta film was achieved using a combined ps- and ns- burst mode (Burst-in-Burst or BiB) of fs-…

physics.optics2025

Ablation of black-Si by (Gauss-)Bessel femtosecond laser beams

Nan Zheng, Hsin-Hui Huang, Nguyen Hoai An Le +7

Laser machining and modification of black-Si (b-Si) by femtosecond laser Gaussian (G-) and Gauss-Bessel (GB-) beams are compared at a wavelength of 1030 nm. The GB-beam was generat…