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cond-mat.mtrl-sci2009
Optical Trajectory of the Insulator-to-metal Transition of Ultra-thin Gold Films
Xuefeng Wang, Ming Zhao, David D Nolte
We apply interferometric picometrology to measure the complex refractive index and dielectric properties of ultra-thin gold films as a continuous function of thickness from 0.2 nm…
cond-mat.mtrl-sci2008
Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology
Xuefeng Wang, Yong P. Chen, David D. Nolte
We apply spinning-disc picometrology to measure the complex refractive index of graphene on thermal oxide on silicon. The refractive index varies from n = 2.4-1.0i at 532 nm to n =…