654 citations · 771 across the 3 of their papers we have counts for
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Characterizing Voltage Contrast in Photoelectron Emission Microscopy
Vinod K. Sangwan, Vincent W. Ballarotto, Karen Siegrist +1
A non-destructive technique for obtaining voltage contrast information with photoelectron emission microscopy (PEEM) is described. Samples consisting of electrically isolated metal…
Defect scattering in graphene
Jian-Hao Chen, W. G. Cullen, C. Jang +2
Irradiation of graphene on SiO2 by 500 eV Ne and He ions creates defects that cause intervalley scattering as evident from a significant Raman D band intensity. The defect scatteri…
Diffusive Charge Transport in Graphene on SiO2
J. -H. Chen, C. Jang, M. Ishigami +3
We review our recent work on the physical mechanisms limiting the mobility of graphene on SiO2. We have used intentional addition of charged scattering impurities and systematic va…