Spatial First-passage Statistics of Al/Si(111)-(root3 x root3) Step Fluctuations

B. R. Conrad, W. G. Cullen, D. B. Dougherty +2

Spatial step edge fluctuations on a multi-component surface of Al/Si(111)-(root3 x root3) were measured via scanning tunneling microscopy over a temperature range of 720K-1070K, fo…