3 papers
cs.AI2025
FBS Model-based Maintenance Record Accumulation for Failure-Cause Inference in Manufacturing Systems
Takuma Fujiu, Sho Okazaki, Kohei Kaminishi +6
In manufacturing systems, identifying the causes of failures is crucial for maintaining and improving production efficiency. In knowledge-based failure-cause inference, it is impor…
cs.IR2025
Fault Cause Identification across Manufacturing Lines through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs
Sho Okazaki, Kohei Kaminishi, Takuma Fujiu +3
Fault cause identification in complex engineered systems remains challenging due to system complexity, frequent reconfigurations, and the limited reusability of accumulated diagnos…
cond-mat.mes-hall2015
Color Atomic Force Microscopy with on-the-fly Morse parameters mapping
Pierre Etienne Allain, Denis Damiron, Yuta Miyazaki +5
Atomic Force Microscopy has enabled 2D imaging at the sub-molecular level, and 3D mapping of the potential field. However, fast identification of the surface still remains a challe…