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20242026
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physics.ins-det2026

Development of a Neutron Imager using CMOS Pixelated Sensor

Yoshio Kamiya, Hidetoshi Ohshita, Ryutaro Nishimura +5

We acquired an image of the Siemens Star Chart using the 10B-INTPIX4 CMOS pixelated imager at J-PARC MLF BL21 (NOVA). The image blurriness, characterized by a root mean square (rms…

physics.ins-det2026

Recent application studies of an INTPIX4NA SOIPIX detector-based X-ray camera using an SiTCP-XG 10GbE-based high-speed readout system at KEK facilities

Ryutaro Nishimura, Noriyuki Igarashi, Daisuke Wakabayashi +10

The Silicon-On-Insulator PIXel (SOIPIX) detector is a unique monolithic structure imaging device currently being developed by the SOIPIX group, led by the High Energy Accelerator R…

physics.ins-det2026

Development of an Extensible Unified Control System Using the STARS Framework and Common Commands for Detector Control

Ryutaro Nishimura, Yuki Shibazaki, Daisuke Wakabayashi +5

Two Fresnel zone plates zooming optics have been successfully developed and installed at the AR-NE1A beamline of the Photon Factory at the high energy accelerator research organiza…

physics.ins-det2025

Development of a new phase-retrieval algorithm from a single-shot image for X-ray schlieren microscopy

Ryutaro Nishimura, Yoshio Suzuki, Hiroshi Sugiyama +5

In this paper, a new phase-retrieval algorithm from an X-ray schlieren image is proposed. The schlieren method allows phase-contrast imaging with an objective lens and a knife-edge…

physics.ins-det2024

X-ray imaging camera using INTPIX4NA SOIPIX detector with SiTCP-XG 10GbE based high-speed readout system

Ryutaro Nishimura, Noriyuki Igarashi, Daisuke Wakabayashi +4

The silicon-on-insulator pixel (SOIPIX) detector is a unique monolithic-structure imaging device currently being developed by the SOIPIX group led by the High Energy Accelerator Re…

physics.ins-det2024

Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays

Ryutaro Nishimura, Shunji Kishimoto, Toshihiko Sasaki +4

Residual stress is an important factor governing evaluating and controlling the quality of metal materials in industrial products. X-ray measurements provide one of the most effect…