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cond-mat.mtrl-sci2026
Atom Probe Tomography as an Emerging Tool for Understanding Defect-driven Mechanisms in HfO-based Ferroelectrics
Kasper A. Hunnestad, Catherine Dubourdieu, Alexei Gruverman +1
HfO-based ferroelectrics are essential for the next generation of CMOS-compatible memory and logic devices, yet their performance is governed by a complex interplay between o…
cond-mat.mtrl-sci2024
AFM-based Functional Tomography-To Mill or not to Mill, that is the Question!
Niyorjyoti Sharma, Kristina M. Holsgrove, James Dalzell +8
The electrical response of ferroelectric domain walls is often influenced by their geometry underneath the sample surface. Tomographic imaging in these material systems has therefo…