◍wovepaper
SearchResearchersInstitutions
Sign in
researcher

Rathin Das

8 papers hereh-index 211 citations11 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author6
  • middle author1
  • last author1

Across the 8 of 8 papers where every author was matched, so the position is known.

fields
  • stat.AP7
  • stat.ME1

identity via Semantic Scholar / OpenAlex

activity
20242026
most citedDetermination of Optimum Warranty Region for Two Dimensional Dependent Data

1 citations · 1 across the 7 of their papers we have counts for

collaborators
Showing 2024Show all

3 papers · 1 filter

stat.AP2024

Reliability Acceptance Sampling Plans under Progressive Type-I Interval Censoring Schemes in Presence of Dependent Competing Risks

Rathin Das, Soumya Roy, Biswabrata Pradhan

We discuss the development of reliability acceptance sampling plans under progressive Type-I interval censoring schemes in the presence of competing causes of failure. We consider…

stat.AP2024

Bayesian reliability acceptance sampling plans under adaptive simple step stress partial accelerated life test

Rathin Das, Biswabrata Pradhan

In the traditional simple step-stress partial accelerated life test (SSSPALT), the items are put on normal operating conditions up to a certain time and after that the stress is in…

stat.AP2024

Bayesian reliability acceptance sampling plan with optional warranty under hybrid censoring

Rathin Das, Biswabrata Pradhan

This work considers design of Bayesian reliability acceptance sampling plan (RASP) under hybrid censored life test for the products sold under optional warranty. The consumer and m…

◍wovepaper

Papers, researchers and institutions, woven together.

Explore
  • Search
  • Researchers
  • Institutions
Account
  • Library
  • Chat
Data
  • arXiv.org
  • Semantic Scholar
  • OpenAlex
  • Latest RSS
AboutContactPrivacyDevelopersllms.txtopenapi.json
Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.