activity
20072022
most citedEffect of boron and phosphorus codoping on the electronic and optical properties of graphitic carbon nitride monolayers: First-principle simulations

63 citations · 157 across the 5 of their papers we have counts for

collaborators

5 papers

physics.app-ph2022★ 41 cited

Unified Modeling and Experimental Realization of Electrical and Thermal Percolation in Polymer Composites

Navid Sarikhani, Zohreh S. Arabshahi, Abbas Ali Saberi +1

Correlations between electrical and thermal conduction in polymer composites are blurred due to the complex contribution of charge and heat carriers at the nanoscale junctions of f…

cond-mat.mtrl-sci2018★ 63 cited

Effect of boron and phosphorus codoping on the electronic and optical properties of graphitic carbon nitride monolayers: First-principle simulations

Mahdieh Yousefi, Monireh Faraji, Reza Asgari +1

We study the effect of boron (B) and Phosphorous (P) co-doping on electronic and optical properties of graphitic carbon nitride (g-CN or GCN) monolayer using density functi…

cond-mat.mtrl-sci2013★ 14 cited

Surface roughness analysis of the hydrophilic SiO_2/TiO_2 nano bi-layers by Level crossing approach

E. Daryaei, M. Reza Rahimi Tabar, A. Z. Moshfegh

The effect of etching time on the statistical properties of the hydrophilic surface of SiO_2/TiO_2/Glass nano bi-layer has been studied using Atomic Force Microscopy (AFM) and stoc…

physics.data-an2007★ 35 cited

Controlling surface statistical properties using bias voltage: Atomic force microscopy and stochastic analysis

P. Sangpour, G. R. Jafari, O. Akhavan +2

The effect of bias voltages on the statistical properties of rough surfaces has been studied using atomic force microscopy technique and its stochastic analysis. We have characteri…

physics.data-an2007★ 4 cited

The Effect of Annealing Temperature on Statistical Properties of Surface

G. R. Jafari, A. A. Saberi, R. Azimirad +2

We have studied the effect of annealing temperature on the statistical properties of surface using atomic force microscopy techniques (AFM). We have applied both level cross…