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cond-mat.mes-hall2024
Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
José Bustamante, Yoichi Miyahara, Logan Fairgrieve-Park +5
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron char…
cond-mat.mes-hall2024★ 1 cited
Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interface
Megan Cowie, Procopios C. Constantinou, Neil J. Curson +2
We use electrostatic force microscopy to spatially resolve random telegraph noise at the Si/SiO interface. Our measurements demonstrate that two-state fluctuations are localize…