16 citations · 17 across the 5 of their papers we have counts for
4 papers · 1 filter
Probing Electrocatalytic Gas Evolution Reaction at Pt by Force Noise Measurements. Part 1-Hydrogen
Nataraju Bodappa, Zixiao Zhang, Ramin Yazdaanpanah +4
Electrocatalytic processes occurring at the heterogeneous interface are complex and their understanding at the molecular level remains challenging. Atomic force microscope (AFM) ca…
Needle in a haystack: efficiently finding atomically defined quantum dots for electrostatic force microscopy
José Bustamante, Yoichi Miyahara, Logan Fairgrieve-Park +5
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron char…
Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO2 interface
Megan Cowie, Procopios C. Constantinou, Neil J. Curson +2
We use electrostatic force microscopy to spatially resolve random telegraph noise at the Si/SiO interface. Our measurements demonstrate that two-state fluctuations are localize…
Low Temperature Electrostatic Force Microscopy of a Deep Two Dimensional Electron Gas using a Quartz Tuning Fork
J. A. Hedberg, A. Lal, Y. Miyahara +5
Using an ultra-low temperature, high magnetic field scanning probe microscope, we have measured electric potentials of a deeply buried two dimensional electron gas (2DEG). Relying…