New experimental evidence for the role of long-range potential fluctuations in the mechanism of 1/f noise in a-Si:H

J. P. R. Bakker, P. J. S. van Capel, B. V. Fine +1

We present measurements of 1/f resistance noise in three different films of amorphous silicon (a-Si) in the presense of a transverse electric current. Two of these films have n-i-n…