56 citations · 134 across the 9 of their papers we have counts for
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Resolving the Electron Plume within a Scanning Electron Microscope
Francis M. Alcorn, Christopher Perez, Eric J. Smoll +7
Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the num…
Quantitative determination of twist angle and strain in Van der Waals moiré superlattices
Steven J. Tran, Jan-Lucas Uslu, Mihir Pendharkar +9
Scanning probe techniques are popular, non-destructive ways to visualize the real space structure of Van der Waals moirés. The high lateral spatial resolution provided by these tec…
Thermal relaxation of strain and twist in ferroelectric hexagonal boron nitride moiré interfaces
Marisa Hocking, Christina E. Henzinger, Steven Tran +6
New properties can arise at van der Waals (vdW) interfaces hosting a moiré pattern generated by interlayer twist and strain. However, achieving precise control of interlayer twist/…
Torsional Force Microscopy of Van der Waals Moirés and Atomic Lattices
Mihir Pendharkar, Steven J. Tran, Gregory Zaborski +13
In a stack of atomically-thin Van der Waals layers, introducing interlayer twist creates a moiré superlattice whose period is a function of twist angle. Changes in that twist angle…
Torsional Periodic Lattice Distortions and Diffraction of Twisted 2D Materials
Suk Hyun Sung, Yin Min Goh, Hyobin Yoo +12
Twisted 2D materials form complex moiré structures that spontaneously reduce symmetry through picoscale deformation within a mesoscale lattice. We show twisted 2D materials contain…