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cond-mat.mes-hall2010
Contactless measurement of electrical conductance of a thin film of amorphous germanium
T. S. Mentzel, K. MacLean, M. A. Kastner
We present a contactless method for measuring charge in a thin film of amorphous germanium (a-Ge) with a nanoscale silicon MOSFET charge sensor. This method enables the measurement…
cond-mat.mes-hall2010★ 2 cited
The Effect of Electrostatic Screening on a Nanometer Scale Electrometer
Kenneth MacLean, Tamar S. Mentzel, Marc A. Kastner
We investigate the effect of electrostatic screening on a nanoscale silicon MOSFET electrometer. We find that screening by the lightly doped p-type substrate, on which the MOSFET i…