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cs.CV2026
Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation
Ni Li, Nuohao Liu, Ryan Jacobs +5
Analyzing microstructural defects in transmission electron microscopy (TEM) images, particularly in irradiated metal alloys, is often limited by the availability of high-quality, l…
cs.CV2025
Predicting Performance of Object Detection Models in Electron Microscopy Using Random Forests
Ni Li, Ryan Jacobs, Matthew Lynch +3
Quantifying prediction uncertainty when applying object detection models to new, unlabeled datasets is critical in applied machine learning. This study introduces an approach to es…
cs.CV2024★ 4 cited
Accelerating Domain-Aware Electron Microscopy Analysis Using Deep Learning Models with Synthetic Data and Image-Wide Confidence Scoring
Matthew J. Lynch, Ryan Jacobs, Gabriella Bruno +3
The integration of machine learning (ML) models enhances the efficiency, affordability, and reliability of feature detection in microscopy, yet their development and applicability…