Nitish Shukla

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20232026

most citedEfficient Mixed-Type Wafer Defect Pattern Recognition Using Compact Deformable Convolutional Transformers

1 citations · 2 across the 13 of their papers we have counts for

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cs.LG2023

Generating Adversarial Attacks in the Latent Space

Nitish Shukla, Sudipta Banerjee

Adversarial attacks in the input (pixel) space typically incorporate noise margins such as $L_{1}$ or $L_{\infty}$ -norm to produce imperceptibly perturbed data that confound deep lea…

cs.LG2023

Mixed-Type Wafer Classification For Low Memory Devices Using Knowledge Distillation

Nitish Shukla, Anurima Dey, Srivatsan K

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defec…