most citedExtraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses by FIB Passive Voltage Contrast

1 citations · 1 across the 1 of their papers we have counts for

collaborators

1 paper

cs.CR2025★ 1 cited

Extraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses by FIB Passive Voltage Contrast

Andrew D. Zonenberg, Antony Moor, Daniel Slone +2

CMOS one-time-programmable (OTP) memories based on antifuses are widely used for storing small amounts of data (such as serial numbers, keys, and factory trimming) in integrated ci…