A. Bortone

most citedSearch for the lepton number violation decay

ω \to π^{+} π^{+} e^{-} e^{-} + c . c .

1 citations · 1 across the 4 of their papers we have counts for

collaborators

4 papers

hep-ex2025★ 1 cited

Search for the lepton number violation decay $ω \to π^{+} π^{+} e^{-} e^{-} + c . c .$

BESIII Collaboration, M. Ablikim, M. N. Achasov +689

The lepton number violation decay $ω \to π^{+} π^{+} e^{-} e^{-} + c . c .$ is searched for via $J / ψ \to ω η$ using a data sample of $(1.0087 \pm 0.0044) \times 1 0^{10}$ $J / ψ$ events collected by…

hep-ex2025

Measurements of branching fractions of $D^{0} \to K^{-} 3 π^{+} 2 π^{-}$ , $D^{0} \to K^{-} 2 π^{+} π^{-} 2 π^{0}$ and $D^{+} \to K^{-} 3 π^{+} π^{-} π^{0}$

BESIII Collaboration, M. Ablikim, M. N. Achasov +687

Utilizing $7.9 f b^{- 1}$ of $e^{+} e^{-}$ collision data taken with the BESIII detector at the center-of-mass energy of 3.773 GeV, we report the measurements of absolute branching f…

physics.ins-det2025

The development of IBIC microscopy at the 100 kV ion implanter of the University of Torino (LIUTo) and the application for the assessment of the radiation hardness of a silicon photodiode

Emilio Corte, Alberto Bortone, Elena Nieto Hernández +6

The Ion Beam Induced Charge (IBIC) technique is widely used to characterize the electronic properties of semiconductor materials and devices. Its main advantage over other charge c…

hep-ex2024

Measurement of the Branching Fraction for the Decay $χ_{c J} \to p p ˉ η π^{0}$

BESIII Collaboration, M. Ablikim, M. N. Achasov +650

Using $(2712.4 \pm 14.3) \times 1 0^{6} ψ (3686)$ events collected by the BESIII detector operating at the BEPCII collider, we present the first observations of the decays $χ_{cJ}(J=0,1,2…

Search for the lepton number violation decay ω→π+π+e−e−+c.c.

Measurements of branching fractions of D0→K−3π+2π−, D0→K−2π+π−2π0 and D+→K−3π+π−π0

The development of IBIC microscopy at the 100 kV ion implanter of the University of Torino (LIUTo) and the application for the assessment of the radiation hardness of a silicon photodiode

Measurement of the Branching Fraction for the Decay χcJ​→ppˉ​ηπ0

Search for the lepton number violation decay $ω \to π^{+} π^{+} e^{-} e^{-} + c . c .$

Measurements of branching fractions of $D^{0} \to K^{-} 3 π^{+} 2 π^{-}$ , $D^{0} \to K^{-} 2 π^{+} π^{-} 2 π^{0}$ and $D^{+} \to K^{-} 3 π^{+} π^{-} π^{0}$

Measurement of the Branching Fraction for the Decay $χ_{c J} \to p p ˉ η π^{0}$