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Ch. Simon

1 paper here

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author position
  • middle author1

Across the 1 of 1 paper where every author was matched, so the position is known.

fields
  • cond-mat.str-el1

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most citedThickness-dependence of the electronic properties in V2O3 thin films

47 citations · 47 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.str-el2007★ 47 cited

Thickness-dependence of the electronic properties in V2O3 thin films

C. Grygiel, Ch. Simon, B. Mercey +3

High quality vanadium sesquioxide V2O3 films (170-1100 Å) were grown using the pulsed laser deposition technique on (0001)-oriented sapphire substrates, and the effects of film thi…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.