47 citations · 55 across the 7 of their papers we have counts for
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Testing and Characterization of Wafer-Scale MAPS Prototypes for the ALICE ITS3 Upgrade
Nicolas Tiltmann
The ALICE experiment will upgrade the innermost three layers of its vertexing detector, the Inner Tracking System (ITS), during the next LHC Long Shutdown (LS3) with a novel, bent,…
Characterisation of the first wafer-scale prototype for the ALICE ITS3 upgrade: the monolithic stitched sensor (MOSS)
Omar Abdelrahman, Gianluca Aglieri Rinella, Luca Aglietta +136
This paper presents the characterisation and testing of the first wafer-scale monolithic stitched sensor (MOSS) prototype developed for the ALICE ITS3 upgrade that is to be install…
Yield, noise and timing studies of ALICE ITS3 stitched sensor test structures: the MOST
Jory Sonneveld, René Barthel, Szymon Bugiel +18
In the LHC long shutdown 3, the ALICE experiment upgrades the inner layers of its Inner Tracker System with three layers of wafer-scale stitched sensors bent around the beam pipe.…
Further Characterisation of Digital Pixel Test Structures Implemented in a 65 nm CMOS Process
Gianluca Aglieri Rinella, Nicole Apadula, Anton Andronic +55
The next generation of MAPS for future tracking detectors will have to meet stringent requirements placed on them. One such detector is the ALICE ITS3 that aims to be very light at…
Exploring unique design features of the Monolithic Stitched Sensor with Timing (MOST): yield, powering, timing, and sensor reverse bias
Mariia Selina, R. Barthel, S. Bugiel +18
Monolithic stitched CMOS sensors are explored for the upgrade of Inner Tracking System of the ALICE experiment (ITS3) and the R&D of the CERN Experimental Physics Department. To le…
Detection efficiency and spatial resolution of Monolithic Active Pixel Sensors bent to different radii
Anton Andronic, Pascal Becht, Mihail Bogdan Blidaru +37
Bent monolithic active pixel sensors are the basis for the planned fully cylindrical ultra low material budget tracking detector ITS3 of the ALICE experiment. This paper presents r…
Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Gianluca Aglieri Rinella, Giacomo Alocco, Matias Antonelli +91
Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise…
Digital Pixel Test Structures implemented in a 65 nm CMOS process
Gianluca Aglieri Rinella, Anton Andronic, Matias Antonelli +49
The ALICE ITS3 (Inner Tracking System 3) upgrade project and the CERN EP R&D on monolithic pixel sensors are investigating the feasibility of the Tower Partners Semiconductor Co. 6…