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physics.ins-det2024
Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Gianluca Aglieri Rinella, Giacomo Alocco, Matias Antonelli +91
Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise…
physics.ins-det2024★ 4 cited
Simulations and Performance Studies of a MAPS in 65 nm CMOS Imaging Technology
Adriana Simancas, Justus Braach, Eric Buschmann +22
Monolithic active pixel sensors (MAPS) produced in a 65 nm CMOS imaging technology are being investigated for applications in particle physics. The MAPS design has a small collecti…