4 citations · 9 across the 9 of their papers we have counts for
3 papers · 1 filter
Laboratory and beam-test performance study of a 55m pitch iLGAD sensor bonded to a Timepix3 readout chip
Peter Svihra, Richard Bates, Justus Braach +5
This contribution reports on characterisation results of a large-area (2) small pitch (55m) inverse Low-Gain Avalanche Detector (iLGAD), bonded to a Timepix3 re…
Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Gianluca Aglieri Rinella, Giacomo Alocco, Matias Antonelli +91
Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise…
Simulations and Performance Studies of a MAPS in 65 nm CMOS Imaging Technology
Adriana Simancas, Justus Braach, Eric Buschmann +22
Monolithic active pixel sensors (MAPS) produced in a 65 nm CMOS imaging technology are being investigated for applications in particle physics. The MAPS design has a small collecti…