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cs.CV2026
From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration
Ziwei Wei, Yao Shen, Wanheng Lu +2
Scanning Probe Microscopy or SPM offers nanoscale resolution but is frequently marred by structured artefacts such as line scan dropout, gain induced noise, tip convolution, and ph…
cs.CV2024
Adaptive Prompt Learning with SAM for Few-shot Scanning Probe Microscope Image Segmentation
Yao Shen, Ziwei Wei, Chunmeng Liu +4
The Segment Anything Model (SAM) has demonstrated strong performance in image segmentation of natural scene images. However, its effectiveness diminishes markedly when applied to s…