10 citations · 15 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2007★ 10 cited
CCD Thermoreflectance Thermography System: Methodology and Experimental Validation
P. -L. Komarov, M. G. Burzo, P. -E. Raad
This work introduces a thermoreflectance-based system designed to measure the surface temperature field of activated microelectronic devices at submicron spatial resolution with ei…
cond-mat.mtrl-sci2007★ 5 cited
A Coupled Thermoreflectance Thermography Experimental System and Ultra-Fast Adaptive Computational Engine for the Complete Thermal Characterization of Three-Dimensional Electronic Devices: Validation
Peter E. Raad, Pavel L. Komarov, M. Burzo
This work builds on the previous introduction [1] of a coupled experimental-computational system devised to fully characterize the thermal behavior of complex 3D submicron electron…