most citedSEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image

7 citations · 7 across the 8 of their papers we have counts for

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cs.LG2026

TrainSDC: Characterizing and Mitigating Silent Data Corruption in Large Language Model Training

Zhipeng Xia, Haotian Xu, Siyu Yun +4

LLM training is increasingly vulnerable to silent data corruption (SDC), yet existing protection methods largely treat Transformer computations uniformly because their vulnerabilit…

cs.LG2025

Unitho: A Unified Multi-Task Framework for Computational Lithography

Qian Jin, Yumeng Liu, Yuqi Jiang +2

Reliable, generalizable data foundations are critical for enabling large-scale models in computational lithography. However, essential tasks-mask generation, rule violation detecti…