9 citations · 9 across the 4 of their papers we have counts for
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Resolving Overlapping EBSD Patterns by Experiment -- Simulation Residuals Analysis
Grzegorz Cios, Aimo Winkelmann, Tomasz Tokarski +2
In the technique of Electron Backscatter Diffraction (EBSD), the accurate detection and identification of different phases existing in a sample is often limited by overlapping Kiku…
Simulation-based Super-Resolution EBSD for Measurements of Relative Deformation Gradient Tensors
Aimo Winkelmann, Grzegorz Cios, Konrad Perzyński +4
We summarize a data analysis approach for electron backscatter diffraction (EBSD) which uses high-resolution Kikuchi pattern simulations to measure isochoric relative deformation g…
Pattern Matching Workflows for EBSD Data Analysis: Quartz Chirality Mapping
Grzegorz Cios, Aimo Winkelmann, Tomasz Tokarski +1
Pattern matching approaches to electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM) provide qualitatively new possibilities for the microstructural ana…
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries
Grzegorz Cios, Aimo Winkelmann, Gert Nolze +3
Electron backscatter diffraction (EBSD) patterns can exhibit Kikuchi bands with inverted contrast due to anomalous absorption. This can be observed, for example, on samples with na…