2 papers
physics.app-ph2025
Voltage Noise Thermometry in Integrated Circuits at Millikelvin Temperatures
G. Ridgard, M. Thompson, L. Schreckenberg +5
This paper demonstrates the use of voltage noise thermometry, with a cross-correlation technique, as a dissipation-free method of thermometry inside a CMOS integrated circuit (IC).…
cond-mat.mes-hall2024
Experimental set-up for thermal measurements at the nanoscale using an SThM probe with niobium nitride thermometer
R. Swami, G. Julie, S. Le-Denmat +9
Scanning Thermal Microscopy (SThM) has become an important measurement tool for characterizing the thermal properties of materials at the nanometer scale. This technique requires a…