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cond-mat.mtrl-sci2010
Real-time observation of bond-by-bond interface formation during the oxidation of (111) Si
B. Gokce, E. J. Adles, D. E. Aspnes +1
Atomic-level structure of solids is typically determined by techniques such as X-ray and electron diffraction,1, 2, 3, 4 which are sensitive to atomic positions. It is hardly neces…
cond-mat.mtrl-sci2009
Chemical-etch-assisted growth of epitaxial zinc oxide
E. J. Adles, D. E. Aspnes
We use real-time spectroscopic polarimetric observations of growth and a chemical model derived therefrom, to develop a method of growing dense, two-dimensional zinc oxide epitaxia…