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physics.ins-det2024
Bounds on Distinguishing Separated Wires Using Magnetic Field Measurements
Adrian Mariano, Jacob Lenz, Dmitro Martynowych +2
Magnetic current imaging (MCI) is useful for non-destructive characterization of microelectronics, including both security analysis and failure analysis, because magnetic fields pe…
physics.ins-det2024
Hardware Trojan Detection Potential and Limits with the Quantum Diamond Microscope
Jacob N. Lenz, Scott K. Perryman, Dmitro J. Martynowych +2
The Quantum Diamond Microscope (QDM) is an instrument with a demonstrated capability to image electrical current in integrated circuits (ICs), which shows promise for detection of…