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most citedEffect of Edge Roughness on Electronic Transport in Graphene Nanoribbon Channel Metal Oxide Semiconductor Field-Effect Transistors

125 citations · 125 across the 4 of their papers we have counts for

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physics.app-ph2025

Engineering Cryogenic FETs: Addressing SCEs and Impact of Interface Traps Down to 2 K Temperature

Nilesh Pandey, Dipanjan Basu, Sanjay K. Banerjee

This paper presents the design and benchmarking of cryogenic bulk-FETs using an experimentally calibrated TCAD framework that integrates 2-D electrostatics and interface-trap effec…