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Sparks of Artificial General Intelligence(AGI) in Semiconductor Material Science: Early Explorations into the Next Frontier of Generative AI-Assisted Electron Micrograph Analysis
Sakhinana Sagar Srinivas, Geethan Sannidhi, Sreeja Gangasani +2
Characterizing materials with electron micrographs poses significant challenges for automated labeling due to the complex nature of nanomaterial structures. To address this, we int…
Multi-Modal Instruction-Tuning Small-Scale Language-and-Vision Assistant for Semiconductor Electron Micrograph Analysis
Sakhinana Sagar Srinivas, Geethan Sannidhi, Venkataramana Runkana
We present a novel framework for analyzing and interpreting electron microscopy images in semiconductor manufacturing using vision-language instruction tuning. The framework employ…
Hierarchical Network Fusion for Multi-Modal Electron Micrograph Representation Learning with Foundational Large Language Models
Sakhinana Sagar Srinivas, Geethan Sannidhi, Venkataramana Runkana
Characterizing materials with electron micrographs is a crucial task in fields such as semiconductors and quantum materials. The complex hierarchical structure of micrographs often…
Preliminary Investigations of a Multi-Faceted Robust and Synergistic Approach in Semiconductor Electron Micrograph Analysis: Integrating Vision Transformers with Large Language and Multimodal Models
Sakhinana Sagar Srinivas, Geethan Sannidhi, Sreeja Gangasani +2
Characterizing materials using electron micrographs is crucial in areas such as semiconductors and quantum materials. Traditional classification methods falter due to the intricate…
Foundational Model for Electron Micrograph Analysis: Instruction-Tuning Small-Scale Language-and-Vision Assistant for Enterprise Adoption
Sakhinana Sagar Srinivas, Chidaksh Ravuru, Geethan Sannidhi +1
Semiconductor imaging and analysis are critical yet understudied in deep learning, limiting our ability for precise control and optimization in semiconductor manufacturing. We intr…