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physics.app-ph2023★ 8 cited
Autonomous convergence of STM control parameters using Bayesian Optimization
Ganesh Narasimha, Saban Hus, Arpan Biswas +2
Scanning Tunneling microscopy (STM) is a widely used tool for atomic imaging of novel materials and its surface energetics. However, the optimization of the imaging conditions is a…
cond-mat.mtrl-sci2023
Human-in-the-loop: The future of Machine Learning in Automated Electron Microscopy
Sergei V. Kalinin, Yongtao Liu, Arpan Biswas +5
Machine learning methods are progressively gaining acceptance in the electron microscopy community for de-noising, semantic segmentation, and dimensionality reduction of data post-…