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cond-mat.mes-hall2024
Statistical Analysis of Spurious Dot Formation in SiMOS Single Electron Transistors
Kuan-Chu Chen, Clement Godfrin, George Simion +8
The spatial distribution of spurious dots in SiMOS single-electron transistors (SETs), fabricated on an industrial 300 mm process line, has been statistically analyzed. To have a d…
cond-mat.mes-hall2024
Industrial 300mm wafer processed spin qubits in natural silicon/silicon-germanium
Thomas Koch, Clement Godfrin, Viktor Adam +11
The realisation of an universal quantum computer will require the operation of thousands to millions of qubits. The possibility of using existing industrial semiconductor fabricati…