20 citations · 28 across the 10 of their papers we have counts for
4 papers · 1 filter
Achieving 5-angstrom-resolution diffraction contrast with an uncorrected electron probe and nanosized defect characterizations
Yao Li, Austin C. Houston, Ziang Yu +8
Atomic-resolution micrographs remain limited in application due to small field of view and low numbers of recorded defects. Defect imaging with reliable statistics in transmission…
Hierarchical automation of scanning probe microscopy through agentic orchestration and algorithmic control
Boris N. Slautin, Sheryl L. Sanchez, Aidan Swanger +5
Rapid advances in agentic artificial intelligence enable scientific systems to interpret open-ended objectives, combine heterogeneous information, invoke specialized tools, and rev…
From Photons to Electrons: Accelerated Materials Discovery via Random Libraries and Automated Scanning Transmission Electron Microscopy
Boris Slautin, Kamyar Barakati, Utkarsh Pratiush +10
The real-world implementation of materials prediction algorithms remains limited by persistent characterization bottlenecks in materials discovery, where photon-based probe techniq…
Towards Self-Optimizing Electron Microscope: Robust Tuning of Aberration Coefficients via Physics-Aware Multi-Objective Bayesian Optimization
Utkarsh Pratiush, Austin Houston, Richard Liu +2
Realizing high-throughput aberration-corrected Scanning Transmission Electron Microscopy (STEM) exploration of atomic structures requires rapid tuning of multipole probe correctors…