2 citations · 8 across the 10 of their papers we have counts for
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Achieving 5-angstrom-resolution diffraction contrast with an uncorrected electron probe and nanosized defect characterizations
Yao Li, Austin C. Houston, Ziang Yu +8
Atomic-resolution micrographs remain limited in application due to small field of view and low numbers of recorded defects. Defect imaging with reliable statistics in transmission…
From Photons to Electrons: Accelerated Materials Discovery via Random Libraries and Automated Scanning Transmission Electron Microscopy
Boris Slautin, Kamyar Barakati, Utkarsh Pratiush +10
The real-world implementation of materials prediction algorithms remains limited by persistent characterization bottlenecks in materials discovery, where photon-based probe techniq…
Direct observation of ultrafast defect-bound and free exciton dynamics in defect-engineered WS monolayers
Tae Gwan Park, Xufan Li, Kyungnam Kang +7
Defects in two-dimensional transition metal dichalcogenides (TMDCs) broadly affect their optical and electronic properties. Directly capturing the ultrafast processes of exciton tr…
Ultralight High-Entropy Nanowire Scaffolds for Extreme-Temperature Functionality
Cameron S. Jorgensen, Corisa Kons, William Stallions +3
High-entropy alloys (HEAs) combine compositional disorder with exceptional functional tunability, yet their inherently high-density limits use in lightweight systems. Here, we intr…
Towards Self-Optimizing Electron Microscope: Robust Tuning of Aberration Coefficients via Physics-Aware Multi-Objective Bayesian Optimization
Utkarsh Pratiush, Austin Houston, Richard Liu +2
Realizing high-throughput aberration-corrected Scanning Transmission Electron Microscopy (STEM) exploration of atomic structures requires rapid tuning of multipole probe correctors…