most citedDeep Learning Techniques for Automatic Lateral X-ray Cephalometric Landmark Detection: Is the Problem Solved?

2 citations · 2 across the 1 of their papers we have counts for

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cs.CV2024★ 2 cited

Deep Learning Techniques for Automatic Lateral X-ray Cephalometric Landmark Detection: Is the Problem Solved?

Hongyuan Zhang, Ching-Wei Wang, Hikam Muzakky +13

Localization of the craniofacial landmarks from lateral cephalograms is a fundamental task in cephalometric analysis. The automation of the corresponding tasks has thus been the su…