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cs.CV2026
TEMPL: A Resource-Efficient and Transparent Model-Free Framework for Pseudo-Label Generation in Material CT Scans
Ashiqur Rahman, Venkata Devesh Reddy Seethi, Austin Yunker +2
The scarcity of large annotated datasets limits deep learning (DL) segmentation in material CT analysis. DL-based pseudo-labeling can help, but it is often computationally expensiv…
cs.CV2025
Effective Defect Detection Using Instance Segmentation for NDI
Ashiqur Rahman, Venkata Devesh Reddy Seethi, Austin Yunker +3
Ultrasonic testing is a common Non-Destructive Inspection (NDI) method used in aerospace manufacturing. However, the complexity and size of the ultrasonic scans make it challenging…