activity
20082026
most citedFast generation of calculated ADF-EDX scattering cross-sections under channelling conditions

5 citations · 7 across the 4 of their papers we have counts for

collaborators
Showing 2023Show all

1 paper · 1 filter

physics.comp-ph2023★ 2 cited

Deep convolutional neural networks to restore single-shot electron microscopy images

I. Lobato, T. Friedrich, S. Van Aert

State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) hav…