Kondo frustration via charge fluctuations: a route to Mott localisation

Abhirup Mukherjee, N. S. Vidhyadhiraja, A. Taraphder +1

We propose a minimal effective impurity model that captures the phenomenology of the Mott-Hubbard metal-insulator transition (MIT) of the half-filled Hubbard model on the Bethe lat…