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20242026
most citedIs Chain-of-Thought Reasoning of LLMs a Mirage? A Data Distribution Lens

5 citations · 7 across the 11 of their papers we have counts for

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cs.CV2025★ 1 cited

SparseC-AFM: a deep learning method for fast and accurate characterization of MoS with C-AFM

Levi Harris, Md Jayed Hossain, Mufan Qiu +6

The increasing use of two-dimensional (2D) materials in nanoelectronics demands robust metrology techniques for electrical characterization, especially for large-scale production.…